Worst case analysis of Boost electronic circuit

SONG Jianqing; LI Chuan; LIU Shuo

doi:10.3969/j.issn.1002-087X.2021.06.031

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Chinese Journal of Power Sources ›› 2021, Vol. 45 ›› Issue (6) : 814-817. DOI: 10.3969/j.issn.1002-087X.2021.06.031

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Worst case analysis of Boost electronic circuit

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 45(6): 814-817 https://doi.org/10.3969/j.issn.1002-087X.2021.06.031

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Received	Published
2020-11-19	2021-06-20
Issue Date
2024-10-25

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